Publication Date:
2015-08-11
Description:
Author(s): F. Dorchies, F. Festa, V. Recoules, O. Peyrusse, A. Benuzzi-Mounaix, E. Brambrink, A. Levy, A. Ravasio, M. Koenig, T. Hall, and S. Mazevet The use of the x-ray absorption K -edge slope is investigated as a model-free diagnostic of the electronic temperature in warm dense matter. Data are reported for aluminum in a wide domain of densities (approximately one to three times the solid density) and temperatures ( ∼ 0.1 – 10 eV ). Measurements are… [Phys. Rev. B 92, 085117] Published Mon Aug 10, 2015
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics