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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 4379-4383 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A set of resistivity-temperature (R-T) curves measured under various applied fields in a high-Tc Bi-Pb-Sr-Ca-Cu-O thin film which has a zero-resistance temperature Tc0 of 110 K is reported. The remarkable broadening of the transition width is discussed under the flux-creep model, considering the very short coherence length of this oxide superconductor. The resistivity is thermally activated, which is consistent with the Arrhenius law with a magnetic field and orientation-dependent activation energy U0(H,aitch-theta). The U0(H,aitch-theta) has a very high value of 381.6 meV under a field of 0.1 T parallel to the c axis. The upper critical field Hc2 determined from these R-T curves shows high values and the effect of flux creep to the Hc2(0) is examined by the irreversible behavior with the "giant'' flux-creep model.
    Type of Medium: Electronic Resource
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