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Scanning tunneling microscopy of step bunching on vicinal GaAs(100) annealed at high temperatures (1994)

Skala, S. L. ; Chou, S. T. ; Cheng, K.-Y. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 65 (1994), S. 722-724

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: Step bunching and terrace widening are observed with scanning tunneling microscopy on GaAs(100), tilted 2° toward [1¯10] and [110], after annealing in ultrahigh vacuum at 600 °C. The resulting surface consists of two separate phases, c(8×2) reconstructed terraces and a bunched step region that is either amorphous or (2×6) reconstructed. Average terrace widths increase to 2 or 4 times the nominal average terrace width for a 2° miscut and steps are correspondingly compressed by 40% or 75% depending on the misorientation direction. The observed step bunching is explained by a thermodynamic instability against facetting resulting from a high step energy on c(8×2) reconstructed surfaces.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.112236

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