Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
74 (1999), S. 2690-2692
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The crystal structure and microstructural evolution of Sr–Bi–Ta–O films grown on LaAlO3 substrates were investigated using x-ray diffraction and cross-sectional transmission electron microscopy. It was found that the epitaxial low-temperature phase found in the as-deposited and 650 °C heat-treated films has a fluorite structure (CaF2-type structure) with a face-centered-cubic symmetry. From the electron diffraction patterns for the fluorite phase, {〈fraction SHAPE="CASE"〉12〈fraction SHAPE="CASE"〉12〈fraction SHAPE="CASE"〉12} and {100}-type superlattice spots were observed. The epitaxial fluorite phase was gradually encroached upon by polycrystalline layered perovskite SrBi2Ta2O9 grains during heat treatment at 750 °C. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.123938
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