ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
The effect of the depth z0 of a stacking fault and the specimen thickness t on the displacement and splitting of higher-order diffraction fringes has been observed experimentally by means of large-angle convergent-beam electron diffraction and simulated theoretically under the two-beam dynamical approximation. Moreover, a quantitative relationship between the displacement and splitting of a diffraction fringe on the one hand and the displacement vector R of the stacking fault, the specimen thickness t, and the diffraction-vector amplitude g on the other hand, was deduced in the thin-specimen approximation when the fault lies at the midpoint of the specimen (z0 = t/2).
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0108767389001297
