ISSN:
1572-9672
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract The two-dimensional electron spectrometer onFreja consists of a ‘top-hat’-type electrostatic analyzer with the addition of entrance aperture deflection plates. The field of view of the concentric-hemisphere analyzer is modified from a plane to a cone up to 25° from this plane by application of bipolar high voltages to the deflection plates. Fast high-voltage sweeps allow full 10 eV–25 KeV, 500-point distribution function measurements in 32 ms. Constant-energy or limited energy-sweep modes allow time resolutions down to 1 ms. A set of electronics combines the electron data with F4 wave data to allow on-board calculations of cross-correlations between electron fluxes and wave electric fields. Additionally, a fast signal processor is capable of searching the electron pulse sequence from one or several channeltrons for high-frequency modulations in the electron flux.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00756884
