Publication Date:
2015-08-06
Description:
Author(s): T. Mazet, D. Malterre, M. François, L. Eichenberger, M. Grioni, C. Dallera, and G. Monaco We investigate the composition and temperature (10–450 K) dependence of the Yb valence in YbMn 6 Ge 6 − x Sn x ( x = 0.0 , 3.8, 4.2, 4.4, and 5.5) using resonant inelastic x-ray scattering (RIXS). The observed change in the Yb valence with composition (from υ ∼ 3 for x = 0 to υ ∼ 2.7 for x = 5.5 ) is likely driven by n… [Phys. Rev. B 92, 075105] Published Wed Aug 05, 2015
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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