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  • 1
    Electronic Resource
    Electronic Resource
    Ferroelectric properties of alkoxy-derived CaBi2Ta2O9 thin films (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 3779-3780 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: CaBi2Ta2O9 thin films were deposited on Pt-passivated quartz glass substrates. The 750 °C-annealed thin film was a single phase of layer-structured perovskite and showed random orientation. The thin film exhibited a P–E hysteresis loop. The remanent polarization (Pr) and coercive electric field (Ec) at 13 V were 6 μC/cm2 and 160 kV/cm, respectively. The polarization did not show fatigue after 2×1010 switching cycles. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1290257
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  • 2
    Electronic Resource
    Electronic Resource
    Processing of Oriented K(Ta,Nb)O3 Films Using Chemical Solution Deposition (1999)
    Westerville, Ohio : American Ceramics Society
    Journal of the American Ceramic Society 82 (1999), S. 0 
    Details
    ISSN: 1551-2916
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: K(Ta,Nb)O3 (KTN) thin films have been prepared by the chemical solution deposition method. KTN precursors consisted of a uniform mixture of K[Ta(OC2H5)6] and K[Nb(OC2H5)6] with interaction at the molecular level. Perovskite KTN thin films with the desired composition (Ta/Nb = 65/35, 50/50, and 35/65) were synthesized from the precursor solutions by the dip coating method. KTN thin films with (100) preferred orientation were successfully synthesized on MgO(100) and Pt(100)/MgO(100) substrates. X-ray pole figure measurements showed that grains of KTN films had a prominent three-dimensional regularity on MgO(100) and Pt(100)/MgO(100) surfaces. The Curie temperatures of KTN films decreased with increasing Ta/Nb ratio. Typical P-E hysteresis loops were observed for KTN thin films of three compositions on Pt(100)/MgO(100) substrates. The values of remanent polarization (Pr) of KTN films increased as the Ta/Nb ratio changed from 65/35 to 35/65.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1151-2916.1999.tb01942.x
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  • 3
    Electronic Resource
    Electronic Resource
    Effects of BaBi2Ta2O9 thin buffer layer on crystallization and electrical properties of CaBi2Ta2O9 thin films on Pt-coated silicon (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 5088-5092 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Non-c-axis oriented CaBi2Ta2O9 (CBT) thin films have been successfully deposited via the triple alkoxide solution method on Pt-coated Si substrates by inserting BaBi2Ta2O9 (BBT) thin buffer layers. The BBT thin buffer layer, which was prepared on Pt-coated Si, was a key material for suppression of the nonpolar c-axis orientation and promoting the ferroelectric structure perpendicular to the in-plane direction of CBT thin film. The annealing temperature and thickness of the BBT thin buffer layers affected the dielectric, ferroelectric, and fatigue properties of the stacked CBT/BBT thin films. The resultant 650 °C annealed CBT/BBT(30 nm) thin film exhibited good P–E hysteresis properties and fatigue behaviors. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1361242
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  • 4
    Electronic Resource
    Electronic Resource
    Phase transition, ferroelectric, and dielectric properties of layer-structured perovskite CaBi3Ti3O12−δ thin films (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 397-399 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of a bismuth-based layer-structured perovskite compound with a number of oxygen octahedron along the c axis between Bi–O layers of three, CaBi3Ti3O12−δ, were prepared using a mixture solution of complex alkoxides. The films crystallized below 550 °C. The crystal structure and surface morphology of these films changed between 600 and 650 °C. The 650 °C-annealed thin film consisted of well-developed grains and exhibited polarization–electric hysteresis loops. The remanent polarization and coercive electric field were 8.5 μC/cm2 and 124 kV/cm, respectively, at 7 V. The dielectric constant and loss factor were about 250 and 0.048, respectively, at 100 kHz. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1385195
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  • 5
    Electronic Resource
    Electronic Resource
    Ferroelectric properties of alkoxy-derived CaBi4Ti4O15 thin films on Pt-passivated Si (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 1119-1121 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: CaBi4Ti4O15 (CBTi144) thin films were prepared by spin coating a precursor solution of metal alkoxides. As-deposited thin films began crystallization below 550 °C and reached full crystallinity of a single phase of layered perovskite at 650 °C via rapid thermal annealing in oxygen. The 650 °C annealed CBTi144 thin film showed random orientation on Pt-passivated Si substrate and exhibited P-E hysteresis loops. The remanent polarization (Pr) and coercive electric field (Ec) were 9.4 μC/cm2 and 106 kV/cm, respectively, at 11 V. The dielectric constant and loss factor were 300 and 0.033, respectively, at 100 kHz. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1349871
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  • 6
    Electronic Resource
    Electronic Resource
    Analysis of warranty claim data: a literature review (2005)
    Bingley : Emerald
    International journal of quality & reliability management 22 (2005), S. 667-686 
    Details
    ISSN: 0265-671X
    Source: Emerald Fulltext Archive Database 1994-2005
    Topics: Economics
    Notes: Purpose - To provide a brief survey of the literature directed towards the analysis of warranty claim data. Design/methodology/approach - For convenience, this survey of the analysis of warranty claims data is somewhat arbitrarily be classified by topics as follows: age-based claims analysis, aggregated warranty claims analysis, marginal counts of claims analysis, warranty claims analysis by using covariates, estimation of lifetime distribution using supplementary data, two-dimensional warranty, warranty costs analysis, sales lag and reporting lag analysis, and forecasts of warranty claims. Findings - Emphasis is placed on a discussion of different kinds of warranty claims data selected from reviews and on a comparison of the statistical models and methods used to analyze such data. Research limitations/implications - Since the literature on product warranty data is vast, more work on this problem is needed. Practical implications - This review points out why warranty claims data is important and gives a survey of the literature pertaining to the analysis of such data. The emphasis is on the analysis of minimal databases of real warranty data, constructed by combining information from different sources, which can be collected economically and efficiently through service networks. The research is applicable for those responsible for product reliability, product design decisions and warranty management in manufacturing industries. Originality/value - The paper reviews different statistical models and methods used to analyze warranty claims data. The statistical models and methods presented are be valuable and meaningful tools for product reliability and warranty management and analysis.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1108/02656710510610820
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  • 7
    Electronic Resource
    Electronic Resource
    An optimal policy for partially observable Markov decision processes with non-independent monitors (2005)
    Bingley : Emerald
    Journal of quality in maintenance engineering 11 (2005), S. 228-238 
    Details
    ISSN: 1355-2511
    Source: Emerald Fulltext Archive Database 1994-2005
    Topics: Technology , Economics
    Notes: Purpose - This research investigated the optimal structure of a discrete-time Markov deterioration system monitored by multiple non-independent monitors. The purpose is to obtain a sufficient condition with which the optimal policy is given by a control limit policy. Design/methodology/approach - The model of this research is formulated as a partially observable Markov decision process. The problem is to obtain an optimal policy which can minimize the expected total discounted cost over an infinite horizon. Findings - The research found that the expected optimal cost function over an infinite horizon has a property of control limit policy given the conditions that a transition probability having a property of totally positive of order 2 and a conditional probability of the monitors having a property of weak multivariate monotone likelihood ratio. Furthermore, we showed that the optimal policy has only four action regions at most. Practical implications - If the optimum policy can be limited to a control limit policy, the tremendous amount of calculation time required to find the optimum procedure can be reduced. This enables the best decision to be identified in a much shorter period of time. Originality/value - A deterioration system monitored incompletely by one monitor has been studied in the previous research. This research considered the case of a multiple number monitors whose observations were not independent.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1108/13552510510616441
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  • 8
    Electronic Resource
    Electronic Resource
    Microstructure Control of Porous Alumina Film Using Aqueous Sol Containing Trehalose (2007)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 350 (Oct. 2007), p. 7-10 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: To fabricate porous and thick alumina films, we prepared an aqueous alumina hydroxide solcontaining trehalose. The alumina films were deposited by dip-coating technique on glass substratesand heating at 500 °C. The maximum thickness of the film obtained by one-run dip-coating using thesol containing trehalose was over 1000 nm. The film was an aggregate of alumina particles with adiameter of 20-40 nm and pores were interstices between the particles. The porosity of alumina filmcan be controlled in the range of 48-65 % by changing trehalose concentration in the dip-coatingsolution
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/55/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.350.7.pdf
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  • 9
    Electronic Resource
    Electronic Resource
    The Role of Strength, Fracture Cause, and Fracture Location Data on the Reliability Analysis of Ceramics (2007)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 352 (Aug. 2007), p. 17-20 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Strength reliability of ceramics depends on accuracy of parameters involved in the probabilitydistribution function for fracture. The parameters are usually estimated by use of strength data.However, one may have additional information in the experiment, such as fracture cause data,fracture location data, flaw-size data and flaw-orientation data. In this paper, we will incorporatethese additional information in the parameter estimation to improve the accuracy of the reliability. Anew theory on the asymptotic variances is presented
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/55/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.352.17.pdf
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  • 10
    Electronic Resource
    Electronic Resource
    Improvement of Orientation and Characterization of Dielectric Property for (Y,Yb)MnO〈sub〉3〈/sub〉/HfO〈sub〉2〈/sub〉/Si Structures (2007)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 350 (Oct. 2007), p. 107-110 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Y0.5Yb0.5MnO3 ferroelectrics/HfO2 stacking layers were successfully constructed on Si(100)substrates through the chemical solution deposition. The degree of c-axis orientation andmicrostructure of Y0.5Yb0.5MnO3 ferroelectrics was improved by the control of concentration ofprecursor solutions. Capacitance of Pt/Y0.5Yb0.5MnO3/HfO2/Si structure was almost constant over104 s on the retention property
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/55/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.350.107.pdf
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