Publication Date:
2015-10-10
Description:
We have developed a newly designed straining specimen holder for in situ transmission electron microscopy (TEM) compatible with high-angle single tilt-axis electron tomography. The holder can deform a TEM specimen under tensile stress with the strain rate between 1.5 x 10 –6 and 5.2 x 10 –3 s –1 . We have also confirmed that the maximum tilt angle of the specimen holder reaches ±60° with a rectangular shape aluminum specimen. The new specimen holder, termed as ‘straining and tomography holder’, will have wide range potential applications in materials science.
Print ISSN:
0022-0744
Electronic ISSN:
1477-9986
Topics:
Electrical Engineering, Measurement and Control Technology
,
Natural Sciences in General
,
Physics
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