ISSN:
0021-8995
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Metal-insulator-semiconductor (MIS) structures were fabricated by vacuum deposition of various metals like indium, aluminum, and tin on Langmuir-Blodgett (LB) films of cadmium stearate (CdSt2) obtained on polypyrrole (PPY) films electrochemically deposited on indium-tin-oxide glass. Junction parameters such as rectification ratio, barrier height, and work function of such devices were experimentally determined. Passivation of semiconducting polypyrrole film is seen to result in a lower value of the ideality factor. For example, measured ideality factors of CdSt2 LB layer/semiconducting PPY structures are 6.63, 6.57, and 6.54 for various metals like Sn, Al, and In, respectively, in comparison to the values of 8.85, 8.82, and 8.20 obtained with semiconducting PPY interface with same elements. The value of the dielectric constant of the insulating CdSt2 LB film was calculated as 1.84 and this is in reasonable agreement with the value (2.13) reported earlier. © 1996 John Wiley & Sons, Inc.
Additional Material:
4 Ill.
Type of Medium:
Electronic Resource
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