ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A microcomputer-controlled x-ray absorption spectrometer was built which can measure 1000 ms resolved extended x-ray-absorption fine structure for dynamic system of the reaction in solution. Further, we built a new stopped-flow apparatus suitable for x-ray absorption spectroscopy in dispersive mode. The spectrometer integrates the x-ray absorption signals over a time interval (gate time) at any time measured from the time of sample mixing. The gate time depends on the concentration of the sample solution and the x-ray intensity from x-ray generator. The raw data on the time resolved-K-edge absorption are presented to demonstrate the feasibility of this spectrometer. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1146340
Permalink