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  • 1
    Electronic Resource
    Electronic Resource
    Charge freezing and surface anisotropy on magnetite (100) : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 6742-6744 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Scanning tunneling microscope images of the (100) surface of slightly nonstoichiometric magnetite taken at room temperature show static arrays of pairs of Fe2+ ions with short-range order, and a charge fluctuation time greater than 103 s. The surface appears to be a Wigner glass with electron pairs localized on adjacent ions as the basic unit. The explanation of Wigner localization at room temperature on the surface only is that the spin-polarized minority-spin band derived from dyz orbitals is stabilized and narrowed by the absence of an apicial oxygen from the B-site octahedron. This leads to surface anisotropy where the Fe2+ spins are pinned normal to the {100} surfaces. Surface anisotropy is expected to outweigh bulk anisotropy in submicron particles.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352522
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  • 2
    Electronic Resource
    Electronic Resource
    Surface and domain structures of ferroelectric crystals studied with scanning force microscopy (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 7461-7471 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The understanding of the phenomena of ferroelectricity requires profound knowledge of the ferroelectric domain structure. In this paper we report on the progress of studying ferroelectric domains and domain walls with scanning force microscopy (SFM). Domains and domain walls of ferroelectric crystals of guanidinium aluminum sulfate hexahydrate (GASH) are imaged with SFM. Two sets of complementary results are obtained depending on the operation mode of the instrument. In the non-contact imaging mode (attractive force regime), domain walls are imaged. In the contact imaging mode (repulsive force regime) in addition to the domain wall structure, information about the polarity of the domains is obtained. In these latter images, the opposing contrast of the ferroelectric positive and negative domains is superimposed on the GASH cleavage structure. The imaging mechanism of the contact and noncontact modes are discussed. Corroborating scanning electron microscopy images are presented as well.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354969
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  • 3
    Electronic Resource
    Electronic Resource
    Progress towards spin-polarized scanning tunneling microscopy (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 5489-5499 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Solutions to the main problems in operating a spin-polarized scanning tunneling microscope are discussed. Preliminary experimental results obtained in the course of implementing these solutions are reported. Atomic resolution on Si(111) and Si(100) is achieved with a scanning tunneling microscope (STM) using chromium and iron tips. Fabrication of antiferromagnetic tips of Cr, MnNi, and MnPt is described. A technique of preparation of clean (100) surfaces of Fe3O4 (magnetite) is given. Low-energy electron diffraction patterns were obtained on Fe3O4 for the first time. The first STM experimental results obtained on magnetite in air and in ultrahigh vacuum are reported. Atomic resolution is obtained on Fe3O4 (100) with an ultrahigh vacuum scanning tunneling microscope using iron and tungsten tips. This is the first successful observation of atomic resolution on a ferromagnetic sample using a ferromagnetic tip.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350522
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  • 4
    Electronic Resource
    Electronic Resource
    The topography effect on magnetic images in magnetic force microscopy (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 4767-4771 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This paper discusses the principles of topographic influence on magnetic force microscopy (MFM) response. We present in a theoretical quantitative way the effect from some chosen topographic features on MFM signal and conditions, which should be fulfilled to detect such an effect. We considered two cases of magnetization direction inside the sample, perpendicular and parallel to the surface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.346131
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  • 5
    Electronic Resource
    Electronic Resource
    Molecular surface structure of tetracene mapped by the atomic force microscope (1991)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 94 (1991), S. 8441-8443 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The atomic force microscope has been used to record molecular structure on free-standing organic crystals. A crystal of tetracene has been imaged with molecular resolution which allows the assignment of lattice parameters to the surface layer. The intermolecular spacings on the surface of tetracene correspond remarkably closely with those in the bulk. It is even possible to distinguish between the two translationally inequivalent molecules of the unit cell. The mechanism for using force microscopy to distinguish between different molecular orientations is discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.460077
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  • 6
    Electronic Resource
    Electronic Resource
    Compact, combined scanning tunneling/force microscope (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 3003-3006 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have built a combined scanning tunneling and scanning force microscope. Owing to the compact design of the instrument with Nomarski type of interferometry for lever deflection sensing, we achieved excellent stability with a total rms noise of 0.03–0.04 A(ring) in a frequency bandwidth of 0.01 Hz–2 kHz and a spectral noise density of 2.0×10−4 A(ring)/ (square root of)Hz at higher frequencies ((approximately-greater-than)2 kHz) using cantilevers with compliances of ∼150 N m−1. Simultaneous measurement of constant current contours, the acting forces, and the system compliance allows separation of sample topography from electronic and elastic effects.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142600
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  • 7
    Electronic Resource
    Electronic Resource
    Low temperature magnetic force microscopy (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 2920-2925 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have built a low temperature scanning force microscope which is able to measure contact and noncontact forces using the dc modes of force microscopy. We demonstrate the capabilities of our instrument on a magneto-optical disk at room temperature and at 77 K. Using a ferromagnetic thin film tip, the topography and the micromagnetic stray field of the sample is measured using the dc modes of force microscopy. The topographic and magnetic data are precisely correlated. The circular bit structure and the natural domain structure between the homogeneously magnetized bits is clearly visible. A lateral resolution below 100 nm and a force resolution of 10−12 N is reproducibly achieved.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144383
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  • 8
    Electronic Resource
    Electronic Resource
    A high stability and low drift atomic force microscope (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 3900-3904 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Impressed by the high resolution and easy operation of the new generation scanning tunneling microscopes (STMs), we built a pocket-size high-stability atomic force microscope (AFM) with deflection measurement by tunneling. It was our aim to reach high mechanical and thermal stability of the tunnel junction as well as full compatibility with our existing STM system. Our first AFM scanhead, designed for large scan ranges up to 15 μm, stably measured an artificial grid structure on SiO2, reproducibly showing details of less than 1 nm in size. On this well-defined sample we compared constant force with variable deflection measurements.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143288
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  • 9
    Electronic Resource
    Electronic Resource
    A low temperature ultrahigh vaccum scanning force microscope (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 3625-3640 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: This article describes the design of a versatile ultrahigh vaccum (UHV) low temperature scanning force microscope system. The system allows scanning probe microscopy measurements at temperatures between 6 and 400 K and in magnetic fields up to 7 T. Cantilevers and samples can be prepared in UHV and transferred to the microscope. We describe some technical details of our system and present first measurements performed at different temperatures and in various scanning force microscopy operation modes. We demonstrate distortion free and calibrated images at temperatures ranging from 8 to 300 K, atomic resolution on NaCl at 7.6 K and various magnetic force microscopy images of vortices in high transition temperature superconductors. It is demonstrated that our instrumentation reaches the thermodynamically determined sensitivity limit. Using standard cantilevers force gradients in the 10−6N/m range, corresponding forces of about 10−15N can be measured. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149970
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  • 10
    Electronic Resource
    Electronic Resource
    Piezoelectric inertial stepping motor with spherical rotor (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 3909-3912 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A piezoelectric inertial stepping motor for multiple rotations of small optical or mechanical components has been developed. The spherical rotor can be rotated about two or three orthogonal axes. Angular step resolution of 1 arcsec is achieved and the maximum speed lies in the range of degrees per second. The design is compact and eliminates mechanical backlash. Simple electronic control is achieved with only one wire per rotational axis. Low-voltage signals between 15 and 30 V are sufficient for driving the motor. No voltage is necessary for maintaining the rotor in a static position. A first application is described with laser optics as they are used in the detector of a scanning force microscope, offering the advantage of remote controlled adjustment.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143290
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