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    Electronic Resource
    Springer
    Journal of electroceramics 4 (1999), S. 41-48 
    ISSN: 1573-8663
    Keywords: diffusion ; oxygen ; zinc oxide ; grain boundary ; dopant ; SIMS ; interstitial diffusion
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract 18O diffusion coefficients were measured in zinc oxide ceramics using a secondary ion mass spectrometer. The results are interpreted as indicating extrinsic behavior. The values of the lattice diffusion coefficients with higher valence dopants compared with zinc ions are greater than lower valence dopant such as lithium ions. Using the data at deeper depth, the grain boundary diffusivity of oxide ions was also evaluated. Although the lattice diffusion coefficients varied by two orders of magnitude, the products of grain boundary width and grain boundary diffusion coefficient were less sensitive to the type of dopants.
    Type of Medium: Electronic Resource
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