Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
71 (2000), S. 315-317
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A time delay system of high threshold immunity was constructed with specially designed NAND gates in which the transistors were biased off with a considerably high biasing voltage. Such a system was reliably used in the pulsed power experiment where strong electromagnetic noise was produced and proved itself to be superior to the conventional time delay system consisting of integrated circuit chips in noise immunity. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1150199
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