Publikationsdatum:
1992-04-01
Beschreibung:
A study of X-ray diffraction in single silicon and quartz crystals in a strong ultrasonic field has been carried out. The dependence of diffraction intensity I(w) on sound amplitude w has been obtained right up to the kinematical limit Ik = I(∞). It is shown that the ratio η = I(∞)/I(0) depends on the crystal quality. Experimental data for different reflections, sound frequencies and X-ray wavelengths are compared with the model calculations for several lattice-distortion mechanisms.
Print ISSN:
0021-8898
Digitale ISSN:
1600-5767
Thema:
Geologie und Paläontologie
,
Physik