Publication Date:
2017-11-02
Description:
Author(s): Martin Magnuson, Susann Schmidt, Lars Hultman, and Hans Högberg The electronic structure and chemical bonding in reactively magnetron sputtered Zr H x ( x = 0.15 , 0.30, 1.16) thin films with oxygen content as low as 0.2 at.% are investigated by 4d valence band, shallow 4p core-level, and 3d core-level x-ray photoelectron spectroscopy. With increasing hydrogen content... [Phys. Rev. B 96, 195103] Published Wed Nov 01, 2017
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics