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Leakage effects in n-GaAs MESFET with n-GaAs buffer layer (1983)

Wang, Y. C. ; Bahrami, M.

In: Other Sources

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Publication Date: 2011-08-19

Description: Whereas improvement of the interface between the active layer and the buffer layer has been demonstrated, the leakage effects can be important if the buffer layer resistivity is not sufficiently high and/or the buffer layer thickness is not sufficiently small. It was found that two buffer leakage currents exist from the channel under the gate to the source and from drain to the channel in addition to the buffer leakage resistance between drain and source. It is shown that for a 1 micron gate-length n-GaAs MESFET, if the buffer layer resistivity is 12 OHM-CM and the buffer layer thickness h is 2 microns, the performance of the device degrades drastically. It is suggested that h should be below 2 microns.

Keywords: SOLID-STATE PHYSICS

Type: Commun. and Logic Systems at Millimeter Wave Freq.; 32 p

Format: text

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