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  • 1
    Publication Date: 2016-06-07
    Description: A technique was developed for measuring surface charge distribution near interfaces without placing any measuring apparatus near the face of the samples. The results of measurements which were made on FEP Teflon and Kapton dielectrics, before and after are given flashover, with various types of interfaces. Also given are data showing mean time between flashovers for various configurations exposed to a variety of environmental conditions. Several charge transfer mechanisms are considered as a means by which stable charge distributions may be maintained near interfaces.
    Type: NASA. Lewis Res. Center Proc. of the Spacecraft Charging-Technol. Conf.; p 503-717
    Format: application/pdf
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