Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
62 (1991), S. 1754-1766
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Direct detection of thin-film and interfacial electron-spin resonance (ESR) pushes conventional techniques to the noise limit for those techniques and requires use of large-area samples. Several microstrip resonator structures are compared here to conventional techniques and experimental results reported. Aluminum microstrip resonators are shown to have from 3 to 10 times the sensitivity to two-dimensional systems as waveguide cavities, while needing only about 1/20th the sample area. A microstrip resonator metal-oxide-superconductor field-effect-transistor structure for study of inversion layer conduction electron-spin resonance is reported in which the resonator functions as the gate, and ohmic contact is made to the inversion layer. A "microstrip induction spectrometer'' is described in which a bimodal microstrip resonator is used along with a cryogenically cooled amplifier for study of lines with very long relaxation times. The ultimate sensitivity to Curie law spins of this spectrometer is 1×108 spins in an area of 1 cm2 at 4.2 K for a 1-G linewidth at the onset of saturation. Superconducting microstrip resonators for ESR are reported and their use discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142418
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