Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
62 (1991), S. 1749-1753
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The relative response of Kodak SB film has been measured with a pulsed-laser Al plasma x-ray source in the energy region delimited by the absorption edges of Br (1599 eV) and of Ag (3351 eV) in the photographic emulsion. The data of optical density versus exposure were obtained by recording spectra at different exposures which were controlled by placing stepped Be filters. A significant variation has been observed with earlier results obtained with continuous x-ray sources at high optical densities. The data may be fit with a simple expression of exposure L determined with an arbitrary constant L0 as a function of optical density D with only two parameters, Dsat and k: L = L0/(Dsat/D − 1)1/k. It is found that Dsat=3.45 and k=0.92 over the entire energy range.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142417
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