ALBERT — All Library Books, journals and Electronic Records Telegrafenberg

Hits per page

hit 1 - 1 | 1 hit

Select All Export

Electronic Resource

A spectrometer for the measurement of reflectance-difference spectra (1993)

Lastras-Martínez, L. F. ; Lastras-Martínez, A. ; Balderas-Navarro, R. E.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 64 (1993), S. 2147-2152

add to mindlist on the mindlist

Details

ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: We describe a spectrometer (visible-ultraviolet photon energy range) for the measurement of reflectance-difference spectra of cubic semiconductors. The spectrometer employs a photoelastic modulator to modulate the polarization of the light incident on the sample and allows for a simple procedure to correct the measured spectra for parasitic components associated with such modulation. The instrument reported has a higher throughput than more conventional setups. To illustrate the spectrometer performance we report on reflectance-difference spectra of (001) oriented GaAs single crystals doped with silicon donors at a level of 1018/cm3.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1143952

	Location	Call Number	Expected	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit