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Noise measurements on junction field effect transistors (1994)

Pallottino, Giovanni Vittorio ; Zirizzotti, Achille Emanuele

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 65 (1994), S. 212-220

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: We report the experimental results of noise measurements performed on junction field effect transistors (2SK162) in the frequency range 1–100 kHz, where the internal correlation effects are not negligible. The experimental data have been analyzed to determine the input current noise spectrum and the spectral energy sensitivity of the device, expressed in terms of noise temperature. We obtained Vn(approximately-equal-to)0.6 nV/(square root of)Hz, and In(approximately-equal-to)4 fA/ (square root of)Hz at 1 kHz, In(approximately-equal-to)25 fA/ (square root of)Hz at 100 kHz. We also report and discuss the results of measurements performed at the temperature of 200 K, which show that the reduction of the noise is not very significant for this specific device.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1145210

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