ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Methods to collect two-dimensional time-resolved x-ray diffraction patterns from surfaces/interfaces were developed. Reflection surface x-ray diffraction utilizing high brilliance x rays and a charge coupled device can achieve a time resolution as good as one second. Also, two-dimensional maps of reflectivity rocking curves can be recorded fast enough to monitor growth processes. These methods were demonstrated for the study of Ag and Pb films on Si (111)−(7×7) surfaces. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1435823