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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 1720-1723 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Methods to collect two-dimensional time-resolved x-ray diffraction patterns from surfaces/interfaces were developed. Reflection surface x-ray diffraction utilizing high brilliance x rays and a charge coupled device can achieve a time resolution as good as one second. Also, two-dimensional maps of reflectivity rocking curves can be recorded fast enough to monitor growth processes. These methods were demonstrated for the study of Ag and Pb films on Si (111)−(7×7) surfaces. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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