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Interdiffusion and morphology variation of thin Y–Ba–Cu–O films deposited on MgO substrates during annealing (1991)

Igarashi, Y. ; Fujino, Y.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 70 (1991), S. 7500-7503

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: For the purpose of investigating the interdiffusion properties between thin Y–Ba–Cu–O films of compositions near YBa2Cu3O7−y and MgO substrates, time evolution of both Rutherford backscattering spectra and scanning electron microscope images during annealing were observed. Actual diffusivities of Y, Ba, and Cu elements in the MgO substrates have been found to be extremely smaller than the values previously reported. The origins of the discrepancies between the present and the previously reported results are discussed in connection with the morphology variation of the thin Y–Ba–Cu–O films on the MgO substrates during heat treatments.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.349747

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