ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
Electron diffraction patterns of a sputter-deposited poly crystalline MgO thin film on an SiO2 substrate, of a Ta thin film and of CoCrTa/Cr bilayer films on glass substrates are presented and analyzed based on the theory developed in Paper I [Tang & Laughlin (1996). J. Appl. Cryst. 29, 411–418]. It is found that the MgO film is [001] textured with a distribution angle of 13°. The Ta film is composed both of randomly oriented grains and [011] textured grains. The [011] texture axis distribution angle of the Ta film is determined to be 11° (11{\bar 2}O)CoCrTa/(001)Cr and (10{\bar 1}1)CoCrTa/(011)Cr polycrystalline epitaxy are identified in the CoCrTa/Cr bilayer films. Both the bilayer films have a texture axis distribution angle of 6°.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889896000416
