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Saturation effects in the phonon reflection at a quartz-liquid helium interface (1980)

Schubert, H. ; Leiderer, P. ; Kinder, H.

Springer

Journal of low temperature physics 39 (1980), S. 363-372

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ISSN: 1573-7357

Source: Springer Online Journal Archives 1860-2000

Topics: Physics

Notes: The reflection coefficient of longitudinal 25-GHz phonons at a quartz-liquid 4He interface was measured for various phonon intensities. For thoroughly cleaned quartz surfaces a reflection coefficient of 1 independent of the incident intensity was found. When the sample was covered with a thin hydrocarbon film, however, the reflection coefficient dropped by typically 5–10% when the phonon intensity was low. At high intensities this extra phonon loss disappeared, suggesting the saturation of the inelastic processes at the quartzhelium interface.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00115626

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