ISSN:
1573-482X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract X-ray double diffraction and photoluminescence experiments were performed on a series of CdTe layers grown by MOVPE on CdTe, CdZnTe and GaAs substrates. Some correlation appears between the measured rocking curve widths and impurity-bound exciton linewidth. To analyse these results a model relating the exciton linewidth to the average strain induced by an array of random dislocations has been developed. It appears that X-ray diffraction is also sensitive to non-random dislocation configurations which do not affect luminescence linewidth.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00702919