ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Low-energy electron-induced x-ray spectrometry (LEEIXS) is a soft and ultrasoft x-ray emission technique. The wavelength-dispersive x-ray spectrometer used is equipped with a cold cathode tube. This device acts as an excitation source by bombarding the sample surface with a quasi-monoenergetic electron beam, the energy of which is selectable over the range from 0.5-5 keV. The probed depth, depending among other parameters upon the incident electron beam energy and upon the sample nature, typically ranges from 5 to 150-200 nm, the probed area being ∼1 cm2. The capabilities of this technique in the fields of atomic and molecular surface analyses have been shown for a wide range of applications. The aim of this paper is to point out the ability of this technique to solve some problems dealing with the near-surface analysis of insulating materials and, more particularly, of some metallic oxides.
Additional Material:
10 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740160189
