Publikationsdatum:
2016-04-12
Beschreibung:
We describe a tool for studying the two-dimensional spatial variation in electronic properties of organic semiconductors: the scanning time-of-flight microscope (STOFm). The STOFm simultaneously measures the transmittance of polarized light and time-of-flight current transients with a pixel size
Print ISSN:
0021-8979
Digitale ISSN:
1089-7550
Thema:
Physik