Publication Date:
1993-01-01
Description:
This paper describes the progress in built-in self-test (BIST) since its inception, and the important problems that still need to be solved to make the technique widely acceptable. The paper includes a reference list and an extensive bibliography on the subject matter.
Print ISSN:
1065-514X
Electronic ISSN:
1563-5171
Topics:
Electrical Engineering, Measurement and Control Technology