Publication Date:
2011-06-11
Description:
Annett Thogersen, Margrethe Rein, Edouard Monakhov, Jeyanthinath Mayandi, and Spyros Diplas The atomic structure and composition of noninterfacial ITO and ITO-Si interfaces were studied with transmission electron microscopy and x-ray photoelectron spectroscopy (XPS). The films were deposited by dc magnetron sputtering on monocrystalline p-type (100) Si wafers. Both as deposited and heat tr ... [J. Appl. Phys. 109, 113532 (2011)] published Fri Jun 10, 2011.
Print ISSN:
0021-8979
Electronic ISSN:
1089-7550
Topics:
Physics