Publication Date:
2018-12-06
Description:
Author(s): E. de Clermont Gallerande, D. Cabaret, G. Lelong, C. Brouder, M.-B. Attaiaa, L. Paulatto, K. Gilmore, Ch. J. Sahle, and G. Radtke X-ray Raman scattering (XRS) spectroscopy is a rapidly developing synchrotron-based technique employed to probe the local electronic structure of condensed matter. The use of hard x-rays makes XRS particularly well-suited for studying low-energy edges of bulk materials, even under highly absorbing sample environments, opening up a wealth of possibilities for i n s i t u experiments. Here, the authors propose an efficient method for calculating K -edge XRS spectra, developed within the framework of density functional theory and designed to fully account for the electric multipole transitions observed when a finite momentum is transferred to the photoelectron. [Phys. Rev. B 98, 214104] Published Wed Dec 05, 2018
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
