Publication Date:
2016-12-28
Description:
Author(s): Anup Pandey, Parthapratim Biswas, Bishal Bhattarai, and D. A. Drabold We apply a method called “force-enhanced atomic refinement” (FEAR) to create a computer model of amorphous silicon ( a -Si ) based upon the highly precise x-ray diffraction experiments of Laaziri et al. [ Phys. Rev. Lett. 82 , 3460 (1999) ]. The logic underlying our calculation is to estimate the structur… [Phys. Rev. B 94, 235208] Published Thu Dec 22, 2016
Keywords:
Semiconductors I: bulk
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics