Publication Date:
2016-11-16
Description:
Author(s): A. I. Figueroa, S. L. Zhang, A. A. Baker, R. Chalasani, A. Kohn, S. C. Speller, D. Gianolio, C. Pfleiderer, G. van der Laan, and T. Hesjedal We report a study of the strain state of epitaxial MnSi films on Si(111) substrates in the thick film limit (100–500 Å) as a function of film thickness using polarization-dependent extended x-ray absorption fine structure (EXAFS). All films investigated are phase-pure and of high quality with a shar… [Phys. Rev. B 94, 174107] Published Tue Nov 15, 2016
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics