Publication Date:
2016-05-03
Description:
We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO 3 . At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations ( x - and z -axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.
Print ISSN:
0003-6951
Electronic ISSN:
1077-3118
Topics:
Physics