Publication Date:
2014-11-19
Description:
Author(s): Liang Liu (刘亮), Jiasen Niu (牛佳森), Li Xiang (向黎), Jian Wei (危健), D.-L. Li, J.-F. Feng, X.-F. Han, X.-G. Zhang, and J. M. D. Coey We provide conclusive experimental evidence that zero-bias anomaly in the differential resistance of magnetic tunnel junctions is due to electron-electron interaction (EEI), clarifying a longstanding issue. The magnon effect that caused confusion is now excluded by measuring at low temperatures down... [Phys. Rev. B 90, 195132] Published Tue Nov 18, 2014
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics