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  • 1
    Publication Date: 2013-10-03
    Description: We report on the development of semiconductor double-chirped mirrors with the group delay dispersion of −3,800 ± 100 fs 2 in the wavelength range between 1,058 ÷ 1,064 nm and reflectivity of 99.1 %. The simplified plane-wave reflection transfer method was used to design the mirror multilayer stack. The mirror contains an epitaxial AlAs/GaAs structure topped with a SiNx antireflective layer.
    Print ISSN: 0946-2171
    Electronic ISSN: 1432-0649
    Topics: Physics
    Published by Springer
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