Publication Date:
2013-10-03
Description:
We report on the development of semiconductor double-chirped mirrors with the group delay dispersion of −3,800 ± 100 fs 2 in the wavelength range between 1,058 ÷ 1,064 nm and reflectivity of 99.1 %. The simplified plane-wave reflection transfer method was used to design the mirror multilayer stack. The mirror contains an epitaxial AlAs/GaAs structure topped with a SiNx antireflective layer.
Print ISSN:
0946-2171
Electronic ISSN:
1432-0649
Topics:
Physics