Publication Date:
2013-03-01
Description:
Author(s): Young Jun Oh, Alex Taekyung Lee, Hyeon-Kyun Noh, and K. J. Chang We investigate the Schottky barrier and effective work function (EWF) at TiN/HfO 2 interface through density functional calculations. For different interfaces that consist of either Ti-O or N-Hf interface bonds, the intrinsic metal-induced gap states are nearly independent of the interface structure,... [Phys. Rev. B 87, 075325] Published Thu Feb 28, 2013
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics