Publication Date:
2012-09-05
Description:
Author(s): R. Daudin, T. Nogaret, T. U. Schülli, N. Jakse, A. Pasturel, and G. Renaud Using in situ x-ray diffraction, epitaxial relationships have been measured for different Au deposits on Si(111) surfaces, under ultrahigh vacuum conditions, from room temperature to the eutectic temperature ( T e ) of the AuSi binary system. Epitaxies perpendicular to the substrate have been studied f... [Phys. Rev. B 86, 094103] Published Tue Sep 04, 2012
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics