Publication Date:
2012-05-19
Description:
Author(s): S. Tsunegi, Y. Sakuraba, K. Amemiya, M. Sakamaki, E. Ozawa, A. Sakuma, K. Takanashi, and Y. Ando The depth-resolved x-ray magnetic circular dichroism (XMCD) technique was applied to observe the interfacial and inner magnetic moments in CoFe/MgO and Co 2 MnSi(CMS)/MgO. The magnetic moments of the real interface region (two monolayers from the interface) and the inner layers were separately analyze... [Phys. Rev. B 85, 180408] Published Fri May 18, 2012
Keywords:
Magnetism
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics