Publication Date:
2019-07-13
Description:
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.
Keywords:
Electronics and Electrical Engineering
Type:
GSFC-E-DAA-TN52006
,
GSFC-E-DAA-TN65829
,
Government Microcircuits Applications and Critical Technologies Conference (GOMAC) Tech 2018; Mar 12, 2018 - Mar 15, 2018; Miami, FL; United States
Format:
application/pdf
