Publication Date:
2019-08-13
Description:
We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment data.
Keywords:
Electronics and Electrical Engineering
Type:
GSFC-E-DAA-TN43724
,
NEPP Electronics Technology Workshop (ETW); Jun 26, 2017 - Jun 29, 2017; Greenbelt, MD; United States
Format:
application/pdf