Publication Date:
2019-07-13
Description:
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics.This paper is a summary of test results.
Keywords:
Electronics and Electrical Engineering; Spacecraft Design, Testing and Performance
Type:
GSFC-E-DAA-TN33485
,
Nuclear and Space Radiation Effects Conference (NSREC) 2016; Jul 11, 2016 - Jul 15, 2016; Portland, OR; United States
Format:
application/pdf