Publication Date:
2019-07-13
Description:
A device implantable in Li-ion cells that can generate a hard internal short circuit on-demand by exposing the cell to 60C has been demonstrated to be valuable for expanding our understanding of cell responses. The device provides a negligible impact to cell performance and enables the instigation of the 4 general categories of cell internal shorts to determine relative severity and cell design susceptibility. Tests with a 18650 cell design indicates that the anode active material short to the aluminum cathode current collector tends to be more catastrophic than the 3 other types of internal shorts. Advanced safety features (such as shutdown separators) to prevent or mitigate the severity of cell internal shorts can be verified with this device. The hard short success rate achieved to date in 18650 cells is about 80%, which is sufficient for using these cells in battery assemblies for field-failure-relevant, cell-cell thermal runaway propagation verification tests
Keywords:
Electronics and Electrical Engineering
Type:
JSC-CN-31074
,
Power Sources Conference 2014; Jun 09, 2014 - Jun 12, 2014; Orlando, FL; United States
Format:
application/pdf
