Publication Date:
2019-07-13
Description:
Electronics components have and increasingly critical role in avionics systems and for the development of future aircraft systems. Prognostics of such components is becoming a very important research filed as a result of the need to provide aircraft systems with system level health management. This paper reports on a prognostics application for electronics components of avionics systems, in particular, its application to the Isolated Gate Bipolar Transistor (IGBT). The remaining useful life prediction for the IGBT is based on the particle filter framework, leveraging data from an accelerated aging tests on IGBTs. The accelerated aging test provided thermal-electrical overstress by applying thermal cycling to the device. In-situ state monitoring, including measurements of the steady-state voltages and currents, electrical transients, and thermal transients are recorded and used as potential precursors of failure.
Keywords:
Electronics and Electrical Engineering
Type:
ARC-E-DAA-TN-244
,
2009 IEEE Aerospace Conference; Mar 07, 2009 - Mar 14, 2009; Big Sky, MT; United States
Format:
application/pdf
