Publication Date:
2019-06-28
Description:
Effects of diffraction and nonlinear photographic emulsion characteristics on the performance of deferred electronic heterodyne moire deflectometry are investigated. The deferred deflectometry is used for measurements of nonsteady phase objects where it is difficult to complete the analysis of the field in real time. The sensitivity, accuracy and resolution of the system are calculated and it is shown that they are weakly affected by diffraction and by nonlinear recording. The feactures of the system are significantly improved compared with the conventional deferred intensity moire technique, and are comparable with the online heterodyne moire. The system was evaluated experimentally by deferred measurements of the refractive index gradients of a weak phase object consisting of a large KD*P crystal. This was done by photographing the phase object through a Ronchi grating and analyzing the tranparency with the electronic heterodyne readout system. The results are compared with the measurements performed on the same phase object with online heterodyne moire deflectometry and with heterodyne holographic interferometry methods. Some practical considerations for system improvement are discussed.
Keywords:
ELECTRONICS AND ELECTRICAL ENGINEERING
Type:
NASA-CR-181134
,
NAS 1.26:181134
Format:
application/pdf
