Publication Date:
2011-08-19
Description:
This paper examines bipolar junction transistor models suitable for calculating the effects of large excursions of some of the variables determining the operation of a transistor. Both the Ebers-Moll and Gummel-Poon models are studied, and the junction and diffusion capacitances are evaluated on the basis of the latter model. The most interesting result of this analysis is that a bipolar junction transistor when struck by a cosmic particle may cause a single event upset in an electronic circuit if the transistor is operated at a low forward base-emitter bias.
Keywords:
ELECTRONICS AND ELECTRICAL ENGINEERING
Type:
Journal of Applied Physics (ISSN 0021-8979); 56; 2964-297
Format:
text