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    Precision compliance techniques for slow crack growth measurements (1975)
    In:  CASI
    Details
    Publication Date: 2019-06-27
    Description: A method is presented for using simple electronic components to obtain the high sensitivity needed to measure very slow crack growth rates. The technique presented can reduce the experimental time considerably and also yield a greater amount of data more accurately than optical techniques for measuring crack growth rates.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: NASA-TM-X-64904
    Format: application/pdf
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