Electronic Resource
Oxford, UK
:
Blackwell Publishing Ltd
Sedimentology
20 (1973), S. 0
ISSN:
1365-3091
Source:
Blackwell Publishing Journal Backfiles 1879-2005
Topics:
Geosciences
Notes:
The high voltage electron microscope allows the internal structure of fine quartz sediment particles to be examined. With high accelerating voltages sufficient penetration is obtained for actual particles to be directly examined in the transmission mode. Dislocations have been observed and also various substructures—indicated by Moire patterns—some of which may be due to Dauphine twinning. Some areas of great distortion have been observed at particle edges, but a certain degree of crystallinity appears to be retained.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1111/j.1365-3091.1973.tb02053.x
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