ISSN:
1013-9826
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
In order to develop a cost-effective digital X-ray imaging system, we considered a CMOS(complementary metal-oxide-semiconductor) photodiode array in conjunction with a scintillationscreen. Imaging performance was evaluated in terms of MTF (modulation-transfer function), NPS(noise-power spectrum) and DQE (detective quantum efficiency). The presampled MTF wasmeasured using a slanted-slit method. The NPS was determined by 2-dimensional Fourier analysis.Both the measured MTF and NPS, and a self-developed computational model for the X-ray spectralanalysis were used to determine the spatial frequency-dependent DQE. From the measured MTF, thespatial resolution was found to be about 10.5 line pairs per millimeter (lp/mm). For a 45-kVp tungstenspectrum, the measured DQE around zero spatial frequency was about 40%
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/51/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.321-323.1052.pdf
